NanoMEGAS products combine beam scanning and precession electron diffraction: ASTAR (TEM Phase and orientation mapping), strain mapping at n
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Your results will never be better than your sample preparation. SPI Supplies can help you deliver the highest quality results for your SEM/E
Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys & photovoltaic effects on solar cells to 2D materials research on graphene & molecular electronics.
Two scanning probe microscopy (SPM) techniques—scanning spread resistance microscopy (SSRM) and scanning capacitance microscopy (SCM)—have been used extensively for carrier distribution evaluation of semiconductor devices.
Scanning Microwave Microscopy (SMM) is an electrical characterization technique used to extract material properties at high frequencies with nanometre accuracy.