NanoMEGAS products combine beam scanning and precession electron diffraction: ASTAR (TEM Phase and orientation mapping), strain mapping at n
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World leading manufacturer of photonics technologies who have developed a range of detectors, light sources and cameras specifically designe
in Stages for SPM, Scanning Probe Microscopes, Controllers, Atomic Force Microscopes, Scanning Probe Microscopy, Scanning Electron Microscopes, SPM Nanolithography, Scanning Tunnelling Microscopes, Scanners, Image Analysis for SPM, Cantilevers, Spectrometers for EDX, WDX, EELS
Keysight Technologies (Formerly Agilent) offers high precision microscopes for scientific research including the NEW high-speed 9500 AFM
Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys & photovoltaic effects on solar cells to 2D materials research on graphene & molecular electronics.
Scanning Microwave Microscopy (SMM) is an electrical characterization technique used to extract material properties at high frequencies with nanometre accuracy.
Two scanning probe microscopy (SPM) techniques—scanning spread resistance microscopy (SSRM) and scanning capacitance microscopy (SCM)—have been used extensively for carrier distribution evaluation of semiconductor devices.