NanoMEGAS products combine beam scanning and precession electron diffraction: ASTAR (TEM Phase and orientation mapping), strain mapping at n
in X-Ray Microscopes, Vendors - Digital Imaging & Analysis, Accessories for Scanning Probe Microscopy, X-Ray Microtomography, X-Ray Microtomography, Vendors - High Resolution / Electron Microscopy, X-Ray Microtomography, Metrology & Profilometry, Image Analysis Software, X-Ray Microscopes
Bruker microCT develops and manufactures SkyScan microtomography and nanotomography systems for non-destructive 3D imaging of objects inter
in Image Analysis Hardware, CMOS Cameras, Vendors - Digital Imaging & Analysis, Scanning Heads, Total Internal Reflection Fluorescence / TIRF, Stereomicroscopes, LEDS, Lamps, Infrared Microscopes, Illuminators, Fluorescence Microscopes, Filters and Beamsplitters, Energy Transfer, Confocal Microscopes, Image Intensifiers, Image Analysis Software, CCD Cameras, Raman Microspectroscopy, Transmitted Light Microscopes, Polarized Light Microscopes, Lasers, Fluorescence Imaging and Spectroscopy
Andor is a global leader in pioneering and manufacturing high performance light measuring solutions, including scientific digital cameras an
in Specialized SPM, Atomic Force Microscopes, Specialized SPM, Scanning Electron Microscopes, SPM Nanolithography, Scanning Tunnelling Microscopes, Cantilevers, Vendors - Scanning Probe Microscopy, SPM Nanolithography, Scanning Electron Microscopes
Keysight Technologies (Formerly Agilent) offers high precision microscopes for scientific research including the NEW 9500AFM with Quick Scan
Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys & photovoltaic effects on solar cells to 2D materials research on graphene & molecular electronics.
Two scanning probe microscopy (SPM) techniques—scanning spread resistance microscopy (SSRM) and scanning capacitance microscopy (SCM)—have been used extensively for carrier distribution evaluation of semiconductor devices.
Scanning Microwave Microscopy (SMM) is an electrical characterization technique used to extract material properties at high frequencies with nanometre accuracy.