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Rigaku provides the worlds most complete line of X-ray analytical instruments, including the Rigaku nano3DX X-ray microscope (XRM) and CT L
Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys & photovoltaic effects on solar cells to 2D materials research on graphene & molecular electronics.
Scanning Microwave Microscopy (SMM) is an electrical characterization technique used to extract material properties at high frequencies with nanometre accuracy.
Two scanning probe microscopy (SPM) techniques—scanning spread resistance microscopy (SSRM) and scanning capacitance microscopy (SCM)—have been used extensively for carrier distribution evaluation of semiconductor devices.