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NanoMEGAS

NanoMEGAS

NanoMEGAS products combine beam scanning and precession electron diffraction: ASTAR (TEM Phase and orientation mapping), strain mapping at n

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Recent App Notes more app notes

AFM nanoelectrical characterization

AFM nanoelectrical characterization

in App Notes - Scanning Probe Microscopy

Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys & photovoltaic effects on solar cells to 2D materials research on graphene & molecular electronics.

Vacuum SNDM enhances characterization of carrier distribution in semiconductor materials

Vacuum SNDM enhances characterization of carrier distribution in semiconductor materials

in App Notes - Scanning Probe Microscopy

Two scanning probe microscopy (SPM) techniques—scanning spread resistance microscopy (SSRM) and scanning capacitance microscopy (SCM)—have been used extensively for carrier distribution evaluation of semiconductor devices.

Calibrated complex impedance of cells at GHz frequencies using scanning microwave microscopy

Calibrated complex impedance of cells at GHz frequencies using scanning microwave microscopy

in App Notes - Scanning Probe Microscopy

Scanning Microwave Microscopy (SMM) is an electrical characterization technique used to extract material properties at high frequencies with nanometre accuracy.

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Carbon Coaters and Evaporators

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Microscopy chemicals all

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AFM/SPM Accessories

Bruker AFM Probes has the experience of AFM experts built into every probe. Find...

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