App notes in App Notes - Scanning Probe Microscopy

AFM nanoelectrical characterization


Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys & photovoltaic effects on solar cells to 2D materials research on graphene & molecular electronics.... Read full app note

Calibrated complex impedance of cells at GHz frequencies using scanning microwave microscopy


Scanning Microwave Microscopy (SMM) is an electrical characterization technique used to extract material properties at high frequencies with nanometre accuracy.... Read full app note

Vacuum SNDM enhances characterization of carrier distribution in semiconductor materials


Two scanning probe microscopy (SPM) techniques—scanning spread resistance microscopy (SSRM) and scanning capacitance microscopy (SCM)—have been used extensively for carrier distribution evaluation of semiconductor devices.... Read full app note

Get a charge: Nanoelectrical characterization techniques


The AFM is an excellent tool for measuring topography, but its power extends much further, for instance to characterize electrical properties at the nanoscale.... Read full app note

Correlative high-resolution Raman-AFM-SNOM imaging


Polymers play an essential role in modern materials science. Due to their widely varying mechanical and chemical properties they are used in almost every field of application and remain a dynamic component of the development of new materials...... Read full app note

The application of the NanoWizard® ULTRA Speed A atomic force microscope


The last three decades have seen the rise of the atomic force microscope (AFM) as an indispensable tool for high-resolution structural analysis of specimens ranging from single molecules to complex biological systems.... Read full app note